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H20R120 查看數據表(PDF) - Infineon Technologies

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H20R120 Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
1000ns
Soft Switching Series
IHW20N120R
td(off)
1000ns
td(off)
100ns
tf
0A
10A
20A
30A
Figure 9.
IC, COLLECTOR CURRENT
Typical switching times as a
function of collector current
(inductive load, TJ=175°C,
VCE=600V, VGE=0/15V, RG=47,
Dynamic test circuit in Figure E)
100ns
tf
10Ω
20Ω
30Ω
40Ω
50Ω
60Ω
RG, GATE RESISTOR
Figure 10. Typical switching times as a
function of gate resistor
(inductive load, TJ=175°C,
VCE=600V, VGE=0/15V, IC=20A,
Dynamic test circuit in Figure E)
100ns
td(off)
tf
10ns
25°C 50°C 75°C 100°C 125°C 150°C
TJ, JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature
(inductive load, VCE=600V,
VGE=0/15V, IC=20A, RG=47,
Dynamic test circuit in Figure E)
6V
max.
5V
typ.
4V
min.
3V
2V
-50°C
0°C
50°C
100°C
TJ, JUNCTION TEMPERATURE
Figure 12. Gate-emitter threshold voltage as
a function of junction temperature
(IC = 0.7mA)
Power Semiconductors
6
Rev. 2.4 May 06

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