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MP8799AE 查看數據表(PDF) - Exar Corporation

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MP8799AE Datasheet PDF : 20 Pages
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MP8799
tR
tF
tS
tB
CLOCK
SAMPLE
N–1
AUTO SAMPLE
BALANCE
N
VIH
VIL
AUTO
SAMPLE
BALANCE
N+1
when φS disconnects the latches from the comparators. This de-
lay is called aperture delay (tAP).
The coarse comparators make the first pass conversion and
selects a ladder range for the fine comparators. The fine compa-
rators are connected to the selected range during the next φB
phase.
ANALOG
TS
INPUT
DATA
VOH
VOL
N-1
tDL
tHLD
Figure 1. MP8799 Timing Diagram
φS
VIN
VTAP
Ref
Ladder
φB
φS
VIN
VTAP
φB
φS
Latch
COARSE COMPARATOR
φS
φB
Latch
THEORY OF OPERATION
Analog-to-Digital Conversion
The MP8799 converts analog voltages into 1024 digital
Selected
φB
Range
FINE COMPARATOR
Figure 2. MP8799 Comparators
codes by encoding the outputs of 15 coarse and 67 fine compa-
rators. Digital logic is used to generate the overflow bit. The con- AIN Sampling, Ladder Sampling, and Conversion Timing
version is synchronous with the clock and it is accomplished in 2
clock periods.
The reference resistance ladder is a series of 1025 resistors.
The first and the last resistor of the ladder are half the value of
the others so that the following relations apply:
RREF = 1024 R VREF = VREF(+) – VREF(–) = 1024 LSB
The clock signal generates the two internal phases, φB (CLK
high) and φS (CLK low = sample) (See Figure 2.). The rising
edge of the CLK input marks the end of the sampling phase (φS).
Internal delay of the clock circuitry will delay the actual instant
Figure 3. shows this relationship as a timing chart. AIN sam-
pling, ladder sampling and output data relationships are shown
for the general case where the levels which drive the ladder
need to change for each sampled AIN time point. The ladder is
referenced for both last AIN sample and next AIN sample at the
same time. If the ladder’s levels change by more than 1 LSB,
one of the samples must be discarded. Also note that the clock
low period for the discarded AIN can be reduced to the minimum
tS time of 150 ns.
Short Cycle Sample will be discarded
Hold Reference Value Past
Clock Change for tAP Time
tS
External
Update
References
Settle by Clock Update Time
Reference Stable Time – For Sample AIN1
Reference Stable Time – For Sample AIN2
Clock
Internal
AIN Sample
Window
Ladder Sample
Window (MSB Bank)
AINX0
Sample AIN1
FB
FS
Sample AIN1
Sample Ladder
for AIN1
AINX1
Not
FB
Used
FS
AINX1
Sample AIN2
FB
FS
Sample AIN2
Sample Ladder
for AINX1
Sample Ladder
for AIN2
Sample Ladder
for AINX2
Ladder Compare
(LSB Bank)
External
DATA
Rev. 3.00
Compare Ladder
V/S AINX0
Compare Ladder
V/S AIN1
Compare Ladder
V/S AINX1
DATA AIN0
DATA AINX0
DATA AIN1
Not Used
Figure 3. AIN Sampling, Ladder Sampling & Conversion Timing
Compare Ladder
V/S AIN2
DATA AINX1
Not Used
6

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