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BTS410E2 查看數據表(PDF) - Infineon Technologies

零件编号
产品描述 (功能)
比赛名单
BTS410E2
Infineon
Infineon Technologies Infineon
BTS410E2 Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Parameter and Conditions
at Tj = 25 °C, Vbb = 12 V unless otherwise specified
Symbol
Protection Functions9)
Initial peak short circuit current limit (pin 3 to 5)10),
( max 450 µs if VON > VON(SC) )
Tj =-40°C:
Tj =25°C:
Tj =+150°C:
Repetitive overload shutdown current limit
VON= 8 V, Tj = Tjt (see timing diagrams, page 11)
Short circuit shutdown delay after input pos. slope
VON > VON(SC),
Tj =-40..+150°C:
min value valid only, if input "low" time exceeds 60 µs
Output clamp (inductive load switch off)
at VOUT = Vbb - VON(CL) IL= 40 mA, Tj =-40..+150°C:
IL= 1 A, Tj =-40..+150°C:
Short circuit shutdown detection voltage
(pin 3 to 5)
Thermal overload trip temperature
Thermal hysteresis
Reverse battery (pin 3 to 1) 11)
IL(SCp)
IL(SCr)
td(SC)
VON(CL)
VON(SC)
Tjt
Tjt
-Vbb
BTS 410 E2
Values
Unit
min typ max
9
-- 23 A
-- 12
--
4
-- 15
--
5
-- A
--
-- 450 µs
61 68
--
--
-- 8.5
150
--
-- 10
--
--
73 V
75
-- V
-- °C
-- K
32 V
Diagnostic Characteristics
Open load detection current
(on-condition)
IL (OL)
Tj=-40 ..150°C:
mA
2
-- 150
8) Add IST, if IST > 0, add IIN, if VIN>5.5 V
9) Integrated protection functions are designed to prevent IC destruction under fault conditions described in the
data sheet. Fault conditions are considered as "outside" normal operating range. Protection functions are not
designed for continuous repetitive operation.
10) Short circuit current limit for max. duration of td(SC) max=450 µs, prior to shutdown
11) Requires 150 resistor in GND connection. The reverse load current through the intrinsic drain-source
diode has to be limited by the connected load. Note that the power dissipation is higher compared to normal
operating conditions due to the voltage drop across the intrinsic drain-source diode. The temperature
protection is not active during reverse current operation! Input and Status currents have to be limited (see
max. ratings page 2 and circuit page 7).
Semiconductor Group
4
2003-Oct-01

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