81487EIB 查看數據表（PDF） - Renesas Electronics
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81487EIB Datasheet PDF : 14 Pages
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ISL8487E, ISL81487L, ISL81487E
Human Body Model Testing
As the name implies, this test method emulates the ESD
event delivered to an IC during human handling. The tester
delivers the charge stored on a 100pF capacitor through a
1.5k current limiting resistor into the pin under test. The
HBM method determines an IC’s ability to withstand the ESD
events typically present during handling and manufacturing.
The RS-485 pin survivability on this high ESD family has
been characterized to be in excess of 15kV, for discharges
to GND.
Typical Performance Curves VCC = 5V, TA = 25°C, ISL8487E, ISL81487L and ISL81487E;
Unless Otherwise Specified
90
3.6
80
3.4
70
3.2
RDIFF = 100
60
3
50
2.8
40
2.6
30
20
2.4
RDIFF = 54
10
2.2
0
0
1
2
3
4
5
DIFFERENTIAL OUTPUT VOLTAGE (V)
FIGURE 6. DRIVER OUTPUT CURRENT vs DIFFERENTIAL
OUTPUT VOLTAGE
2
-40 -25
0
25
50
75 85
TEMPERATURE (°C)
FIGURE 7. DRIVER DIFFERENTIAL OUTPUT VOLTAGE vs
TEMPERATURE
160
140
120
ISL81487E
100
Y OR Z = LOW
80
ISL8487E, ISL81487L
60
40
20
0
-20
-40
-60
ISL81487E
-80 ISL8487E, ISL81487L
-100
Y OR Z = HIGH
-120
-7 -6 -4 -2 0
2
4
6
OUTPUT VOLTAGE (V)
8 10 12
FIGURE 8. DRIVER OUTPUT CURRENT vs SHORT CIRCUIT
VOLTAGE
400
ISL81487E, DE = VCC, RE = X
350
ISL81487E, DE = GND, RE = X
300
250
200
ISL8487E, ISL81487L, DE = VCC, RE = X
150
100
-40
ISL8487E, ISL81487L, DE = GND, RE = GND
-25
0
25
50
75 85
TEMPERATURE (°C)
FIGURE 9. SUPPLY CURRENT vs TEMPERATURE
FN6051 Rev.7.00
February 27, 2006
Page 10 of 14
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