AS6C3216A-55BIN
DATA RETENTION CHARACTERISTICS
PARAMETER SYMBOL
TEST CONDITION
VCC for Data Retention
VDR CE#≧VCC - 0.2V or CE2≦0.2V
Data Retention Current
VCC = 1.2V
IDR CE# ≧VCC-0.2V or CE2≦0.2V
Other pins at 0.2V or VCC-0.2V
40℃
85℃
Chip Disable to Data
Retention Time
Recovery Time
tRC* = Read Cycle Time
tCDR See Data Retention Waveforms (below)
tR
DATA RETENTION WAVEFORM
Low VCC Data Retention Waveform (1) (CE# controlled)
Vcc
CE#
Vcc(min.)
tCDR
VIH
VDR ≧ 1.2V
CE# ≧ Vcc-0.2V
Vcc(min.)
tR
VIH
MIN. TYP. MAX. UNIT
1.2 - 3.6 V
- 6.5 18 µA
-
- 80 µA
0
-
tRC*
-
- ns
- ns
Low VCC Data Retention Waveform (2) (CE2 controlled)
Vcc
CE2
Vcc(min.)
tCDR
VIL
VDR ≧ 1.2V
CE2 ≦ 0.2V
Low VCC Data Retention Waveform (3) (LB#, UB# controlled)
Vcc
LB#,UB#
Vcc(min.)
tCDR
VIH
VDR ≧ 1.2V
LB#,UB# ≧ Vcc-0.2V
Vcc(min.)
tR
VIL
Vcc(min.)
tR
VIH
Confidential
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Rev.1.0 June 2017