Description
The Atmel® AT30TSE004 is a combination Serial EEPROM and temperature sensor device containing 4096-bits of Serially Electrically Erasable and Programmable Read-Only Memory (EEPROM) organized as 512-bytes of eight bits each. The Serial EEPROM operation is tailored specifically for DRAM memory modules with Serial Presence Detect (SPD) to store a module’s vital product data such as the module’s size, speed, voltage, data width, and timing parameters.

FEATUREs
● Integrated Temperature Sensor (TS) + 4-Kbit Serial EEPROM
● JEDEC JC42.4 (TSE2004av) DIMM Serial Presence Detect (SPD) + TS compliant
● Low voltage operation
   ● Optimized for VCC range of 1.7V to 3.6V
● 2-wire serial interface: I2C Fast Mode Plus (FM+) compatible
   ● 100kHz, 400kHz, and 1MHz compatibility
   ● Bus Timeout supported
● Schmitt Trigger, filtered inputs for noise suppression
● Industry standard green (Pb/Halide-free/RoHS compliant) package options
   ● 8-pad Ultra Thin DFN (2 x 3 x 0.6mm)
   ● 8-pad Very Very Thin DFN (2 x 3 x 0.8mm)

Temperature Sensor Features
● Highly accurate B-grade temp. measurements requiring no external components
   ● ±1.0°C accuracy (maximum) over the +75°C to +95°C range
   ● ±2.0°C accuracy (maximum) over the +40°C to +125°C range
   ● ±3.0°C accuracy (maximum) over the -20°C to +125°C range
● 11-bit ADC temperature-to-digital converter with 0.125°C resolution
● Programmable hysteresis threshold: off, 0°C, 1.5°C, 3°C, and 6°C
● Low operating current
   ● Temperature sensor active ~0.2mA (typical)

Serial EEPROM Features
● Integrates 4-Kbits of Serial EEPROM
   ● Internally organized into four quadrants of 128-bytes each
● Individual reversible software write protection on all four 128-byte quadrants
● Supports byte and Page Write operations
● Self-timed write cycle (5ms maximum)
● High-reliability
   ● Endurance: 1,000,000 write cycles
   ● Data retention: 100 years
● Low operating current
   ● Serial EEPROM Write ~1.5mA (typical)
   ● Serial EEPROM Read ~0.2mA (typical)