AS6C3216-55TIN 查看數據表（PDF） - Alliance Semiconductor
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AS6C3216-55TIN Datasheet PDF : 13 Pages
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Rev. 1.0
AS6C3216
32M Bits ( 2Mx16 / 4Mx8 Switchable) LOW POWER CMOS SRAM
CAPACITANCE (TA = 25℃, f = 1.0MHz)
PARAMETER
SYMBOL
MIN.
Input Capacitance
CIN
-
Input/Output Capacitance
CI/O
-
Note : These parameters are guaranteed by device characterization, but not production tested.
MAX
6
8
UNIT
pF
pF
AC TEST CONDITIONS
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Reference Levels
Output Load
0.2V to VCC - 0.2V
3ns
1.5V
CL = 30pF + 1TTL, IOH/IOL = -1mA/2mA
AC ELECTRICAL CHARACTERISTICS
(1) READ CYCLE
PARAMETER
SYM.
Read Cycle Time
Address Access Time
Chip Enable Access Time
Output Enable Access Time
Chip Enable to Output in Low-Z
Output Enable to Output in Low-Z
Chip Disable to Output in High-Z
Output Disable to Output in High-Z
Output Hold from Address Change
LB#, UB# Access Time
LB#, UB# to High-Z Output
LB#, UB# to Low-Z Output
tRC
tAA
tACE
tOE
tCLZ*
tOLZ*
tCHZ*
tOHZ*
tOH
tBA
tBHZ*
tBLZ*
AS6C3216-55
MIN.
MAX.
55
-
-
55
-
55
-
30
10
-
5
-
-
20
-
20
10
-
-
55
-
25
10
-
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
(2) WRITE CYCLE
PARAMETER
SYM.
AS6C3216-55
MIN.
MAX.
Write Cycle Time
tWC
55
-
Address Valid to End of Write
tAW
50
-
Chip Enable to End of Write
tCW
50
-
Address Set-up Time
tAS
0
-
Write Pulse Width
tWP
45
-
Write Recovery Time
tWR
0
-
Data to Write Time Overlap
tDW
25
-
Data Hold from End of Write Time tDH
0
-
Output Active from End of Write
tOW*
5
-
Write to Output in High-Z
tWHZ*
-
20
LB#, UB# Valid to End of Write
tBW
45
-
*These parameters are guaranteed by device characterization, but not production tested.
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Alliance Memory, Inc.
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