HS-303CEH 查看數據表（PDF） - Intersil

零件编号

产品描述 (功能)

比赛名单

HS-303CEH

Radiation Hardened BiCMOS Dual SPDT Analog Switch

Intersil 

300

500

HS-303CEH

450

33

25°C

TEST CONDITIONS

LOGIC

MIN

TYP

MAX

UNITS

15

300

500

TRUTH TABLE

450

SW1 AND SW2

SW333AND SW4

FIGURE 3. SWITCHING TEST CIRCUIT

FIGURE 4. SWITCHING TEST CIRCUIT WAVEFORM

W4

FIGURE 5. BREAK-BEFORE-MAKE TEST CIRCUIT

FIGURE 6. BREAK-BEFORE-MAKE TEST CIRCUIT WAVEFORMS

6

FN8399.1

April 19, 2013

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