MC145192DT 查看數據表（PDF） - Motorola => Freescale
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MC145192DT Datasheet PDF : 24 Pages
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LOOP SPECIFICATIONS (VDD = VCC = 2.7 to 5.0 V unless otherwise indicated, TA = – 40° to 85°C)
Symbol
Parameter
Vin Input Voltage Range, fin
(Figure 7)
fref Input Frequency, REFin Externally Driven in
Reference Mode (Figure 8)
fXTAL
fout
f
tw
tTLH,
tTHL
Cin
Crystal Frequency, Crystal Mode
(Figure 9)
Output Frequency, REFout (Figures 10 and 12)
Operating Frequency of the Phase Detectors
Output Pulse Width, φR, φV, and LD
(Figures 11 and 12)
Output Transition Times, LD, φV, and φR
(Figures 11 and 12)
Input Capacitance, REFin
Test Condition
100 MHz ≤ fin < 250 MHz
250 MHz ≤ fin ≤ 1100 MHz
Vin ≥ 400 mV p–p
VDD = 2.7 V
VDD = 3.0 V
VDD = 3.5 V
VDD = 4.5 to 5 V
Vin ≥ 1 V p–p
VDD = 2.7 V
VDD = 3.0 V
VDD = 3.5 V
VDD = 4.5 to 5 V
C1 ≤ 30 pF, C2 ≤ 30 pF, Includes Stray
Capacitance
CL = 30 pF
fR in Phase with fV, CL = 50 pF,
VPD = 2.7 V, VDD = VCC = 2.7 V
CL = 50 pF, VPD = 2.7 V,
VDD = VCC = 2.7 V
Guaranteed
Operating Range
Min
Max
400
1500
200
1500
1
20
4.5
20
5.5
20
12
27
1
20
1.5
20
2
20
4.5
27
2
10
dc
5
dc
1
20
140
—
80
—
5
Unit
mV p–p
MHz
MHz
MHz
MHz
MHz
ns
ns
pF
SINE WAVE
GENERATOR
50 Ω*
1000 pF
fin OUTPUT A
1000 pF DEVICE
Vin
fin
UNDER
TEST
VCC GND VDD
* Characteristic Impedance
TEST
POINT
(fv)
V+
Figure 7. Test Circuit
SINE WAVE
GENERATOR
50 Ω*
0.01 µF
REFin OUTPUT A
DEVICE
Vin
UNDER
TEST
REFout
VCC GND VDD
* Characteristic Impedance
TEST
POINT
(fR)
TEST
POINT
V+
Figure 8. Test Circuit–Reference Mode
TEST
REFin OUTPUT A
POINT
C1
DEVICE
(fR)
UNDER
TEST
REFout
C2
VCC GND VDD
V+
REFout
1 / f REFout
50%
Figure 10. Switching Waveform
Figure 9. Test Circuit–Crystal Mode
tw
90%
OUTPUT 50% 10%
tTHL
tTLH
Figure 11. Switching Waveform
MC145192
6
TEST POINT
DEVICE
UNDER
TEST
CL*
* Includes all probe and
fixture capacitance.
Figure 12. Test Circuit
MOTOROLA
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