TGA1342-EPU(2001) 查看數據表（PDF） - TriQuint Semiconductor
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TGA1342-EPU Datasheet PDF : 8 Pages
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Advance Product Information
TABLE IV
RF ON-WAFER PROBE TEST LIMITS
(TA = 25°C + 5°C)
NOTE
TEST
MEASUREMENT
CONDITIONS
VALUE
MIN TYP MAX
UNITS
1/ Small Signal
Gain Magnitude
F = 6 – 14 GHz
F = 16 – 18 GHz
F = 2 – 20 GHz
Power Output
F = 2 - 20 GHz
@ 1 dB Gain Compression
2/ Noise Figure
1/ Input Return Loss
Magnitude
F = 6 – 15 GHz
F = 18 GHz
F = 2 – 20 GHz
F = 6 – 18 GHz
1/ Output Return Loss
Magnitude
F = 6 – 18 GHz
9
8
9
17.5
dB
dB
dB
dBm
4.5
dB
5.5
dB
3.5
dB
-12
dB
-10.5
dB
1/ RF probe data is taken at 2 GHz steps
2/ RF probe data is taken at 3 GHz steps
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process
specifications. Specifications are subject to change without notice.
TriQuint Semiconductor Texas: Phone (972)994-8465 Fax (972)994 8504 Web: www.triquint.com
5
rev 11/10/98
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