This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1) Standard Metal-Gate CMOS (SMG); 2) Medium-Voltage Metal-Gate CMOS (MV1); 3) Medium-Voltage Silicon-Gate CMOS (MV2); 4) 3µm Silicon-Gate CMOS (SG3); 5) 5µm Silicon Gate CMOS (SG5); 6) 1.2µm Silicon-Gate CMOS; and 7) Bipolar (BIP) processes.
Over 8,967,000 device hours have been accumulated for products stressed at an elevated temperature (135°C) during this period. The data in this report is considered typical of Maxim’s production. As you will see, Maxim’s products demonstrate consistently high reliability.