Test Circuits
BB504M
• DC Biasing Circuit for Operating Characteristics Items (ID(op), |yfs|, Ciss, Coss, Crss, NF, PG)
VG2
Gate 2
RG
VG1
Gate 1
Drain
A
ID
Source
• 200 MHz Power Gain, Noise Figure Test Circuit
VT
1000p
VG2
1000p
VT
1000p
Input(50Ω)
1000p
1000p
47k
47k
BBFET
L1
36p
1000p
1SV70
R G 120k
47k
L2
1000p
Output(50Ω)
10p max
RFC
1SV70
1000p
V D = V G1
Unit Resistance (Ω)
Capacitance (F)
L1 : Φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
L2 : Φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
RFC : Φ1mm Enameled Copper Wire,Inside dia 5mm, 2Turns
3