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MP8830AE 查看數據表(PDF) - Exar Corporation

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MP8830AE Datasheet PDF : 20 Pages
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MP8830
Parameter
Symbol
Min
Typ
Max Units Test Conditions/Comments
3-State Leakage
IOZ
–10
Digital Timing Specifications2
10 µA
In pass-through mode
For testing, rise time = fall time =
10 ns. Output loading = 60 pF except for
AD0-AD9 for which loading is 40 pF. Rise
and fall times faster than 5 ns should be
avoided.
AENL, BENL, CENL
t1
125
ns
Pulse Width
D/A Data Hold Time
t2
20
ns
BENL Rising Edge to CENL Rising t3
270
ns
Edge
AENL Rising Edge to CVL Falling
t4
30
ns
Edge
D/A Data Setup Time
Analog Input Hold Time
t5
20
t6
20
CVL Rising Edge to AENL Rising
t7
230
Edge
ns
ns
Measured as part of analog feedthrough test.
Note, ttapmax < t4min + t6min.
ns
A/D Data Enable Time
t8
40 ns
CVL to Channel A data.
BENL to Channel B data.
CENL to Channel C data.
CENL Rising Edge to CVL Rising
t9
40
ns
Edge
Analog Input Settled to 0.1%
t10
50
ns
Assumes the sample is taken at the rising
edge of AENL.
A/D Data Hold Time
Aperture Delay
t11
20
ns
tAP
20
40 ns
Analog sampling window delay from CVL ris-
ing () edge (start) or AENL rising () edge
(end).
CVL Falling Edge to BENL Rising
t12
180
ns
Edge
Delay from CD5-14 to AD0-9 with
t13
CREN=1
50 ns
Delay from AD0-9 to CD5-14 with
t14
CREN = 1
50 ns
Delay from DCL Falling Edge to
t15
Clamp on.
40 ns
External analog clamp voltage settling de-
pends on external circuitry.
Delay from DCL Rising Edge to
t16
Clamp off.
40 ns
External analog clamp voltage settling de-
pends on external circuitry.
Time for AD0-9 and CD5-14 to switch t17
0
from normal operation to pass
through mode or vise versa (i.e. bus
contention).
40 ns
User should stop driving the bus before
changing the mode and data will not be valid
for 40 ns after a change of mode.
Digital Quiet Time
t18
15
ns
This quiet time is necessary to reduce digital
crosstalk during the critical sampling time.
The accuracy of each conversion may be cor-
rupted due to digital noise on the board during
this period.
Digital Quiet Time
t19
40
ns
This quiet time is necessary to reduce digital
crosstalk during the critical sampling time.
The accuracy of each conversion may be cor-
rupted due to digital noise on the board during
this period.
Notes
1 Production testing performanced at 25°C.
2 Not production tested.
Rev. 1.00
6

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